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Materials functionalities may be associated with atomic-level structural dynamics occurring on the millisecond timescale. However, the capability of electron microscopy to image structures with high spatial resolution and millisecond temporal resolution is often limited by poor signal-to-noise ratios. With an unsupervised deep denoising framework, we observed metal nanoparticle surfaces (platinum nanoparticles on cerium oxide) in a gas environment with time resolutions down to 10 milliseconds at a moderate electron dose. On this timescale, many nanoparticle surfaces continuously transition between ordered and disordered configurations. Stress fields can penetrate below the surface, leading to defect formation and destabilization, thus making the nanoparticle fluxional. Combining this unsupervised denoiser with in situ electron microscopy greatly improves spatiotemporal characterization, opening a new window for the exploration of atomic-level structural dynamics in materials. 

Abstract This study presents functional limit theorems for the Euler characteristic of Vietoris–Rips complexes. The points are drawn from a nonhomogeneous Poisson process on $$\mathbb{R}^d$$ , and the connectivity radius governing the formation of simplices is taken as a function of the time parameter t , which allows us to treat the Euler characteristic as a stochastic process. The setting in which this takes place is that of the critical regime, in which the simplicial complexes are highly connected and have nontrivial topology. We establish two ‘functional-level’ limit theorems, a strong law of large numbers and a central limit theorem, for the appropriately normalized Euler characteristic process. 

Abstract The objective of this study is to examine the asymptotic behavior of Betti numbers of Čech complexes treated as stochastic processes and formed from random points in the d -dimensional Euclidean space $${\mathbb{R}}^d$$ . We consider the case where the points of the Čech complex are generated by a Poisson process with intensity nf for a probability density f . We look at the cases where the behavior of the connectivity radius of the Čech complex causes simplices of dimension greater than $k+1$ to vanish in probability, the so-called sparse regime, as well when the connectivity radius is of the order of $$n^{-1/d}$$ , the critical regime. We establish limit theorems in the aforementioned regimes: central limit theorems for the sparse and critical regimes, and a Poisson limit theorem for the sparse regime. When the connectivity radius of the Čech complex is $$o(n^{-1/d})$$ , i.e. the sparse regime, we can decompose the limiting processes into a time-changed Brownian motion or a time-changed homogeneous Poisson process respectively. In the critical regime, the limiting process is a centered Gaussian process but has a much more complicated representation, because the Čech complex becomes highly connected with many topological holes of any dimension.